? 1999, 2000 mos field effect transistor pa1726 switching n-channel power mos fet industrial use data sheet document no. g14050ej2v0ds00 (2nd edition) date published april 2001 ns cp(k) printed in japan the mark shows major revised points. the information in this document is subject to change without notice. before using this document, please confirm that this is the latest version. not all devices/types available in every country. please check with local nec representative for availability and additional information. description the pa1726 is n -channel mos field effect transistor designed for power management applications of notebook computers and so on. features ? 2.5-v gate drive and low on-resistance r ds(on)1 = 9.1 m ? max. (v gs = 4.5 v, i d = 6.0 a) r ds(on)2 = 10.0 m ? max. (v gs = 4.0 v, i d = 6.0 a) r ds(on)3 = 12.5 m ? max. (v gs = 2.5 v, i d = 6.0 a) ? low c iss : c iss = 2700 pf typ. ? built-in g-s protection diodes ? small and surface mount package (power sop8) ordering information part number package pa1726g power sop8 absolute maximum ratings (t a = 25c, all terminals are connected.) drain to source voltage (v gs = 0 v) v dss 20 v gate to source voltage (v ds = 0 v) v gss 12 v drain current (dc) i d(dc) 12 a drain current (pulse) note1 i d(pulse) 48 a total power dissipation (t a = 25c) note2 p t 2.0 w channel temperature t ch 150 c storage temperature t stg ?55 to +150 c notes 1. pw 10 s, duty cycle 1 % 2. mounted on ceramic subs trate of 1200 mm 2 x 2.2 mm remark the diode connected between the gate and source of the transistor serves as a protector against esd. when this device actually used, an addit ional protection circ uit is externally required if a voltage exc eeding the rated voltage may be applied to this device. package drawing (unit : mm) 1.27 0.12 m 6.0 ?.3 4.4 0.40 +0.10 ? 0.05 0.78 max. 0.05 min. 1.8 max. 1.44 0.8 0.5 ?.2 0.15 +0.10 ? 0.05 5.37 max. 0.10 14 85 1,2,3 4 5,6,7,8 ; source ; gate ; drain equivalent circuit source body diode gate protection diode gate drain
data sheet g14050ej2v0ds 2 pa1726 electrical characteristics (t a = 25 c, all terminals are connected.) characteristics symbol test conditions min. typ. max. unit drain to source on-state resistance r ds(on)1 v gs = 4.5 v, i d = 6.0 a 7.2 9.1 m ? r ds(on)2 v gs = 4.0 v, i d = 6.0 a 7.5 10.0 m ? r ds(on)3 v gs = 2.5 v, i d = 6.0 a 9.1 12.5 m ? gate to source cut-off voltage v gs(off) v ds = 10 v, i d = 1 ma 0.5 1.0 1.5 v forward transfer admittance | y fs |v ds = 10 v, i d = 6.0 a 12 24 s drain leakage current i dss v ds = 20 v, v gs = 0 v 10 a gate to source leakage current i gss v gs = 12 v, v ds = 0 v 10 a input capacitance c iss v ds = 10 v 2700 pf output capacitance c oss v gs = 0 v 880 pf reverse transfer capacitance c rss f = 1 mhz 460 pf turn-on delay time t d(on) i d = 6.0 a 50 ns rise time t r v gs(on) = 4.5 v 170 ns turn-off delay time t d(off) v dd = 10 v 100 ns fall time t f r g = 10 ? 190 ns total gate charge q g i d = 12 a 25 nc gate to source charge q gs v dd = 16 v 4 nc gate to drain charge q gd v gs = 4.5 v 11 nc body diode forward voltage v f(s-d) i f = 12 a, v gs = 0 v 0.8 v reverse recovery time t rr i f = 12 a, v gs = 0 v 50 ns reverse recovery charge q rr di/dt = 100 a/ s50nc test circuit 2 gate charge test circuit 1 switching time pg. r g 0 v gs d.u.t. r l v dd = 1 s duty cycle 1 % v gs wave form i d wave form v gs 10 % 90 % v gs (on) 10 % 0 i d 90 % 90 % t d(on) t r t d(off) t f 10 % i d 0 t on t off pg. 50 ? d.u.t. r l v dd i g = 2 ma
data sheet g14050ej2v0ds 3 pa1726 typical characteristics (t a = 25 c, all terminals are connected.) forward transfer characteristics v gs - gate to source voltage - v i d - drain current - a 0.001 0.01 0.1 01 234 pulsed v ds = 10 v 1 10 100 t a = 125?c t a = 25?c t a = ? 25?c t a = 75?c drain current vs. drain to source voltage v ds - drain to source voltage - v i d - drain current - a 0.0 0.4 0.6 0.8 10 20 30 40 0.2 pulsed 50 v gs = 4.0 v v gs = 2.5 v 0 v gs = 4.5 v drain to source on-state resistance vs. channel temperature t ch - channel temperature - ? c r ds(on) - drain to source on-state resistance - m ? 20 10 0 0 50 100 150 v gs = 2.5 v ? 50 v gs = 4.5 v pulsed drain to source on-state resistance vs. gate to source voltage v gs - gate to source voltage - v r ds(on) - drain to source on-state resistance - m ? 0 5 10 20 16 12 8 4 0 i d = 6.0 a drain to source on-state resistance vs. drain current i d - drain current - a r ds(on) - drain to source on-state resistance - m ? 1 10 100 0.1 0 5 10 15 20 25 30 v gs = 2.5 v v gs = 4.5 v v gs = 4.0 v pulsed gate to source cut-off voltage vs. channel temperature t ch - channel temperature - ? c v gs(off) - gate to source cut-off voltage - v v ds = 10 v i d = 1 ma ? 50 50 100 0 150 0.3 1.0 0.5
data sheet g14050ej2v0ds 4 pa1726 source to drain diode forward voltage v sd - source to drain voltage - v i f - diode forward current - a 0.1 0.0 0.2 0.4 0.6 0.8 1.0 1.2 1.4 1 10 100 1000 pulsed v gs = 4.0 v v gs = 0 v capacitance vs. drain to source voltage v ds - drain to source voltage - v c iss , c oss , c rss - capacitance - pf 0.01 10 100 1000 0.1 10 1 100 v gs = 0 v f = 1 mhz c iss c oss c rss 10000 reverse recovery time vs. drain current i d - drain current - a t rr - reverse recovery time - ns 1 0.1 10 1 10 100 1000 100 di/dt = 100 a/ s v gs = 0 v v gs - gate to source voltage - v dynamic input/output characteristics q g - gate charge - nc v ds - drain to source voltage - v 0 10 20 30 40 60 50 30 25 20 15 10 5 0 v gs v ds v dd = 16 v 10 v 4 v i d = 12 a 12 10 8 6 4 2 0 1 10 100 0.01 0.1 v ds = 10 v pulsed i d - drain current - a | y fs | - forward transfer admittance - s 25 ? c 75 ? c 125 ? c 10 1 0 0.001 100 forward transfer admittance vs. drain current t a = ? 25 ? c
data sheet g14050ej2v0ds 5 pa1726 derating factor of forward bias safe operating area t a - ambient temperature - ? c dt - percentage of rated power - % 0 20 40 60 80 100 120 140 160 20 40 60 80 100 total power dissipation vs. ambient temperature t a - ambient temperature - ? c p t - total power dissipation - w 0 20 40 60 80 100 120 140 160 2.8 2.4 2.0 1.6 1.2 0.8 0.4 mounted on ceramic substrate of 1200 mm 2.2 mm 2 0 remark mounted on ceramic subs trate of 1200 mm 2 2.2 mm transient thermal resistance vs. pulse width pw - pulse width - s r th(t) - transient thermal resistance - ? c/w 10 0.001 0.01 0.1 1 100 1000 1 m 10 m 100 m 1 10 100 1000 mounted on ceramic substrate of 1200 mm 2.2 mm single pulse 2 10 100 r th(ch-a) = 62.5 ? c /w forward bias safe operating area 1 10 100 i d - drain current - a 0.1 v ds - drain to source voltage - v 0.1 1 10 100 0.01 r ds(on) limited (at v gs = 10 v) i d(dc) = 12 a 10 ms 100 ms power dissipation limited 1 ms pw = 100 s t c = 25 ? c single pulse i d(pulse) = 48 a r ds(on) limited (at v gs = 10 v) i d(dc) = 12 a 10 ms 100 ms power dissipation limited 1 ms pw = 100 s t c = 25 ? c single pulse i d(pulse) = 48 a r ds(on) limited (at v gs = 10 v) i d(dc) = 12 a 10 ms 100 ms power dissipation limited 1 ms pw = 100 s t a = 25 ? c single pulse i d(pulse) = 48 a
data sheet g14050ej2v0ds 6 pa1726 [memo]
data sheet g14050ej2v0ds 7 pa1726 [memo]
pa1726 m8e 00. 4 the information in this document is current as of april, 2001. the information is subject to change without notice. for actual design-in, refer to the latest publications of nec's data sheets or data books, etc., for the most up-to-date specifications of nec semiconductor products. not all products and/or types are available in every country. please check with an nec sales representative for availability and additional information. no part of this document may be copied or reproduced in any form or by any means without prior written consent of nec. nec assumes no responsibility for any errors that may appear in this document. nec does not assume any liability for infringement of patents, copyrights or other intellectual property rights of third parties by or arising from the use of nec semiconductor products listed in this document or any other liability arising from the use of such products. no license, express, implied or otherwise, is granted under any patents, copyrights or other intellectual property rights of nec or others. descriptions of circuits, software and other related information in this document are provided for illustrative purposes in semiconductor product operation and application examples. the incorporation of these circuits, software and information in the design of customer's equipment shall be done under the full responsibility of customer. nec assumes no responsibility for any losses incurred by customers or third parties arising from the use of these circuits, software and information. while nec endeavours to enhance the quality, reliability and safety of nec semiconductor products, customers agree and acknowledge that the possibility of defects thereof cannot be eliminated entirely. to minimize risks of damage to property or injury (including death) to persons arising from defects in nec semiconductor products, customers must incorporate sufficient safety measures in their design, such as redundancy, fire-containment, and anti-failure features. nec semiconductor products are classified into the following three quality grades: "standard", "special" and "specific". the "specific" quality grade applies only to semiconductor products developed based on a customer-designated "quality assurance program" for a specific application. the recommended applications of a semiconductor product depend on its quality grade, as indicated below. customers must check the quality grade of each semiconductor product before using it in a particular application. "standard": computers, office equipment, communications equipment, test and measurement equipment, audio and visual equipment, home electronic appliances, machine tools, personal electronic equipment and industrial robots "special": transportation equipment (automobiles, trains, ships, etc.), traffic control systems, anti-disaster systems, anti-crime systems, safety equipment and medical equipment (not specifically designed for life support) "specific": aircraft, aerospace equipment, submersible repeaters, nuclear reactor control systems, life support systems and medical equipment for life support, etc. the quality grade of nec semiconductor products is "standard" unless otherwise expressly specified in nec's data sheets or data books, etc. if customers wish to use nec semiconductor products in applications not intended by nec, they must contact an nec sales representative in advance to determine nec's willingness to support a given application. (note) (1) "nec" as used in this statement means nec corporation and also includes its majority-owned subsidiaries. (2) "nec semiconductor products" means any semiconductor product developed or manufactured by or for nec (as defined above). ? ? ? ? ? ?
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